Tuesday Evening Education Committee
Exhibitor Demonstrations and Tutorials

  

Once again the MSA Education Committee is organizing Exhibitor Demonstrations and Tutorials on Tuesday, August 3 from 6:00 to 8:00 pm in the Exhibit Hall. These mini-seminars or tutorial demonstrations are held in the booths of the participating companies after the Hall is closed to non-participants at ~ 5:00 pm.

Signup sheets with titles and descriptions are at the MSA Education table in the MSA Mega Booth. When you sign up you will be issued a ticket, which you will need to renter the Hall after it is closed. You need to sign up no later than noon on Tuesday. The number of attendees is limited, so visit the MSA Education table soon, since the demonstrations get filled up quickly!

Here's a list of participating Exhibitors and titles:


Vendor
Title/Subject
  4pi Analysis, Inc.Elements of X-Ray Imaging: dynamic mapping using ROI processing, and introductory hyperspectral analysis  
  Bal-Tec AGSEM Controlled Broad Ion Beam Sample Preparation  
  Chroma Technology CorpFilter Design for Fluorescence Microscopy  
  Diatome U.S./Leica MicrosystemsA New Era in Ultramicrotomy: The Oscillating Diamond Knife and the most advanced Ultramicrotome technology  
  EDAX/TSLSimultaneous EBSD and EDS: See what you can do with a Chl-Scan System  
  Hitachi High TechnologiesTEM in a Digital World-Advantages of CCD Integration  
Low Voltage STEM Imaging with FE-SEM  
  HKL TechnologyMicrostructural characterization by SEM Electron Backscatter Diffraction (EBSD)- grains, texture and phase identification  
  Imago Scientific Instruments CorporationNew Developments and Applications in 3-D Imaging and Analysis With Imago's LEAP(R) Microscope  
  NanoTech-AmericaNext Generation AFM  
  QuantomiX, Inc.Electron Microscopy (SEM) of Fully Hydrated Samples - from Cell Biology to Materials  
  Soft Imaging SystemAutomatic Strain Analysis of TEM/CBED Images  
  SPI SuppliesOsmium Plasma Coating for High Resolution FESEM Applications  
  Thermo Electron CorporationIntroduction to modern Raman microscopy as a routine analysis tool for molecular characterization of materials  
Better, Faster, Easier ways to acquire, process and present compositional data  
  XEI SCIENTIFIC Evactron Anti-Contaminator Techniques to keep SEM/FIB chambers Nano-Clean.