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Once again the MSA Education Committee is organizing Exhibitor Demonstrations and Tutorials on Tuesday, August 1 starting at 5:00 pm in the Exhibit Hall. These mini-seminars or tutorial demonstrations are held in the booths of the participating companies after the Hall is closed to non-participants. Reservations sheets with titles and descriptions will be at the MSA Education table in the MSA Mega Booth. When you sign up you will be issued a ticket, which you will need to renter the Hall after it is closed. You need to sign up no later than noon on Tuesday. The number of attendees is limited, so visit the MSA MegaBooth soon, since the demonstrations get filled up quickly! You may download a PDF file with an extended outline of the Exhibitor's Tutorials/Demos here |
| 4pi Analysis, Inc. | Spatial Frame Lock(TM) - Real-time Drift Correction for Electron Imaging Applications and its Extension to Hyperspectral Imaging |
| Alicona Imaging GmbH | 3D Reconstruction of Surfaces with Steep Slopes from Multiple SEM Images |
| Asylum Research | Combined AFM and Optical Microscopy Techniques with the MFP-3D-BIO |
| Bitplane, Inc. | Segmentation and Tracking of Cells in 4D (3D over time) |
| Bruker-AXS Microanalysis | Silicon Drift Detectors (SDD) for X-ray Microanalysis |
| CAMECA Instruments, Inc. | Atom Probe Design Considerations for Best Quantification |
| Carl Zeiss MicroImaging | Confocal Laser Scanning Microscopy in Materials Science |
| Carl Zeiss SMT Inc. | Introducing the Next Level of CrossBeam(R) Performance - Enabling a Nano Age World |
| Diatome U.S./Leica Microsystems | The Preparation and Ultramicrotomy of Hard Industrial Materials |
| Duniway Stockroom | Ion Pumps - Operation and Applications |
| Electron Microscopy Sciences | Aurion BSA-c Background Suppresser and Newly Improved Silver Enhancement Reagent |
| Evex | Improving Spectral Data Collection with a EvexQDD Detector |
| FEI Company |
a) Current capabilities in both corrected and uncorrected Titan S/TEM b) Buyer's Guide to Low Vacuum SEM c) 3D DualBeam Characterization |
| Gatan, Inc. | a) Approaches to Phase Identification and Mapping using Electron Energy Loss in TEM b) EM Sample Preparation: Slope Cutting Technique for Preparation of SEM Cross Sections and Controlled Plasma Cleaning without Sputtering c) Optimized Video Recording Using Digital Streaming Video |
| HORIBA Jobin Yvon, Inc. | Chemical Mapping and Imaging using Raman Microscopy |
| HREM Research, Inc. | Software Cs-corrector |
| Kleindiek Nanotechnik | How to Manipulate Small Objects |
| Leica Microsystems | Correlative Microscopy/How to Prepare a Sample for Live Cell Imaging for both LM and EM |
| McCrone Associates, Inc. | Demonstration of the Linkam Thermal Stage for Polarized Light Microscopy |
| Nanotech America/NT-MDT | AFM-Ultramicrotome Integration - 3D Reconstruction of Internal Structure |
| Omniprobe, Inc. | High Throughput TEM Sample Prep in the FIB |
| Quantomix | WETSEM(TM) Technology for In-Situ Studies of Dynamic Processes in SEM |
| Renishaw plc | Optical Spectroscopy in the SEM - New Tools for Chemical Analysis |
| SEMTech Solutions, Inc. | a) USB X-Stream Imaging System - Converting Analog Scans to Digital Images b) NEW! 3D e-RAM (Electron Roughness Analyzing Microscope) - An E-Beam System Specifically Developed for Surface Roughness Analysis |
| Smart Imaging Technologies | Automating Particle Characterization Using Image Analysis |
| Ted Pella | Controlling the Microwave - The Recipe to Superior Results |
| Thermo Electron Corporation | a) Introduction to Raman Microscopy b) K-Alpha, a New Approach to X-ray Photoelectron Spectroscopy (XPS) c) Automated Feature Sizing with Chemical Typing on an EDS System |