Sub Angstrom Resolution in Diamond
using the OAM Instrument


Courtesy of Michael A. O'Keefe



Two Pre-Meeting events are currently scheduled prior to the MM 2006 Meeting
  • Workshop: New Approaches to Marketing, Managing and Money for Maintaining a Core Facility - July 29, 2006
  • Congress: Materials Research in an Aberration-Free Environment - July 29-30, 2006


Pre-meeting FIG Workshop
July 29, 2006

New Approaches to Marketing, Managing and Money for Maintaining a Core Facility
1-5 PM

Organizers:

  • MSA Facility Operations & Management Focused Interest Group
  • Debra Sherman, Purdue University

This workshop will be presented by the business professionals who will look at the core facilities as small businesses. They will provide pointers on developing a business plan, marketing a facility, and formulating a strategy for maintaining major equipment over the long term.

Workshop Agenda and Registration Form can be found on the FOM FIG WWW Site




Pre-meeting Topical Congress
July 29-30, 2006

Materials Research in an Aberration-Free Environment
Workshop Program

Organizers:


The last decade has seen revolutionary progress in electron optics. Aberration correction systems have been developed for STEM, SEM and TEM modes and have been successfully applied to a wide range of material science problems, e.g. interface structures and imaging of oxygen. A strong impact in the near future on further scientific areas, such as in situ microscopy and biology, can be expected from this rapidly developing field. Hardware development continues with correction of higher order aberrations and chromatic aberration, promising improved resolution, higher beam currents and increasing ease of image interpretation. This session welcomes technological contributions presenting progress in aberration correction in charged particle optics. Equally important are scientific contributions that discuss the current experimental or theoretical limitations imposed by lens aberrations, and future goals that will be achievable by aberration correction. This pre-meeting congress will also offer a forum for presenting new results from the application of aberration correction to challenging scientific problems.


Nestor J. Zaluzec / Zaluzec@Microscopy.Com