| ||||||||||||||
July 30, 2006 |
|
X-11: Scanning Cathodoluminescence Microscopy and Spectroscopy Full Day: 9:00AM-5:00PM Instructors: Matthew R. Phillips and Dominique Drouin |
| Cathodoluminescence in the SEM has been used successfully for many years to non-destructively map in three-dimensions the distribution and concentration of luminescent impurities and point defects in geological specimens, technologically important ceramics and opto-electronic semiconductors. In addition to chemical microanalysis, the CL signal can also provide an abundance of information on the sample's electrical (band gap, carrier lifetimes and diffusion length) and structural properties (strain and deformation) at sub-micron resolution. Recently, there has been rapid improvement in the sensitivity, speed and wavelength measurement range of commercial light detectors. The availability of these new detectors has significantly expanded the analytical capabilities of the CL technique and its range of microcharacterization applications. This short course will cover the basic principles and practices of CL microscopy and spectroscopy and recent developments in the CL technique. The topics will include: an overview of CL generation mechanisms, CL instrumentation and spectral calibration, methods to correct spectral data for system response, experimental CL techniques (such as power-density- and temperature-resolved CL analysis and interpretation of these data), approaches used to assign CL emission peaks to specific recombination centers, depth-resolved CL data analysis using Monte Carlo simulation techniques, CL microanalysis in the low-voltage and variable pressure SEM and current applications of CL microscopy and spectroscopy in materials engineering, nano-technology, and the geo- and biosciences. |
|
X-12: Digital Imaging 101: Scientific Imaging with Photoshop Full day: 9:00AM-5:00PM Instructors: John Mackenzie |
| The workflow for digital imaging in the modern scientific laboratory is still a work in progress. This course will use Adobe Photoshop as the core program in defining this workflow. We will show how digital images can be properly manipulated in Photoshop for display, prints, reports, posters, and publication. The course will demonstrate that gamma correction is critical for achieving publication quality prints. Step by step instructions will show the ease and flexibility of this approach. We will discuss how to acquire the best digital image for a given sample. Resolution issues will be discussed in detail. We will examine what the current best technologies for archiving the image data are and what image formats and standards we should adopt. We will examine in detail image printing. We will emphasize several issues that must be understood in order to produce high quality images every time on any printer. We will discuss the most affordable solutions and discuss methods of obtaining true metrics of performance. |
|
X-13: Digital Imaging 102: Image Processing and Analysis Full Day: 9:00AM-5:00PM Instructor: John Russ |
| This will be an intensive step-by-step illustration of the various steps involved in enhancing images for presentation and extracting numeric data from them for analysis. The emphasis will be on comparison between various approaches applied to representative images, rather than the theoretical underpinnings for the various techniques. Morning: A survey of the principal techniques for image processing will cover spatial domain operations such as histogram modification, convolution with filters, neighborhood ranking operations, etc., showing their use for removal of random noise, correction of nonuniform brightness, enhancement of edges and local detail, etc. Fourier domain processing will be used to remove periodic noise, deconvolve image blur, locate features by cross correlation, and isolate periodic structures. Afternoon: Thresholding of images, and processing of the binary images using morphological operations such as erosion and dilation, skeletonization, watershed segmentation, etc., will be used to delineate features of interest for measurement. The Boolean combination of images and the use of appropriate grids allows straightforward stereological measurements of 3D structure to be performed. Feature-specific measurements provide data on object density (or color), position, size and shape. |
|
X-14: Live Cell Imaging Using Fluorescence Methods Full Day: 9:00AM-5:00PM Instructor: Simon Watkins |
| Returning science to the living cell, tissue or organisms is the goal of post-genomic research. Microscopic imaging tools are one of the principal methodologies that may be applied to the living system. In fact, developments in detectors, computing, and fluorescent proteins have moved these approaches to the center of basic research in living systems. This day long workshop concentrates on live cell imaging using fluorescence methods. The lectures are focused on how to optimize the entire microscope system for live cell imaging. This includes optimization of the stand with the addition of automation and optimized objectives and detectors. Lectures on the fluorescent proteins and their use and comparative value will be presented as well as discussions of the merits of newer methods such as TIRF and multiphoton imaging, Following the lectures, there will be demonstrations using cutting edge integrated systems from the major manufacturers so that students can get a first hands on experience of the power live cell imaging approaches. |
|
X-15: What To Do with a Variable Pressure (VPSEM) or Environmental SEM (ESEM) And How To Do It (Or At Least How It Ought To Work) Full Day: 9:00AM-5:00PM Instructors: Brendan J Griffin and Matthew R Phillips |
| Initial results with variable pressure scanning electron microscopes can be frustrating, and challenges are faced when investigating new materials. A new short course program has been developed with this in mind. The new format will sequentially address VPSEM column components and operation, electron (SE and BSE), light (CL) and x-ray detectors, and then imaging strategies. Practical aspects of operation will follow with a focus on procedures to monitor instrument performance and image quality, using a range of samples as examples. Applications of the novel contrast mechanisms available in VPSEM, including charge contrast imaging, will be considered in detail, as this continues to be a complex area. The use of hot, cool, and cold stages will also be covered. Contributions by manufacturers to the course will be continued, but in a shortened format to allow for more detailed applications-based discussions. The short course will conclude with a final session during which we will build a spreadsheet of application and procedures for the instruments (i.e., what to do when). Examples used during the short course will include biological and physical, with hard and 'soft and squishy' variants. Time will also be devoted to achieving high resolution results on difficult samples, e.g. Cr on quartz (silica) masks. A new area of discussion will be sample preparation and the use and effects of plasma cleaners. Powerpoint presentations will be used with hard copy notes. |
|
X-16: 3-Dimensional Electron Microscopy (3DEM) in Life and Material Science - In-Depth Tutorial about Tomography --Basics and Methods Full day: 9:00AM-5:00PM Instructors: Juergen M. Plitzko and Bram Koster |
| Transmission electron microscopy (TEM) in its various flavours is nowadays an established characterization tool for structures in life as well as in material science. Especially in todays 'nano-world' it is, by and large the only technique for in-depth investigations in the nanometer and even in the sub-nanometer regime. The study of complex materials and hybrid compounds, and their interfaces and defects by TEM was and is a major focus in material science. While life scientists are trying to untangle the secrets of complicated protein structures and the supramolecular architecture of whole cells. Especially in biology where every cell is different, 2 dimensional projections have been found to be clearly insufficient for a complete 3 dimensional characterization. Therefore, 3 dimensional electron microscopy (3DEM) methods have been developed. Electron tomography (ET), at room temperature or under cryo conditions, is one of the methods in 3DEM and it has gained momentum over the last years in both fields. This short course will explain the basics of tomography, the experimental setups and instrumental prerequisites for 3 dimensional work, and the actual solutions. Bright field-, energy-filtered, and STEM tomographic methods for biological applications under low-dose cryo-conditions will be described and explained in detail, as well as their younger 'offsprings' in material science. Since all tomographic methods are based on different reconstruction algorithms, and elaborate image processing and visualization routines, they will be included in this tutorial as well. We intend the course to be of interest to both beginners and already-experienced users of electron tomography. |
|
X-17: Failure Analysis and Evidence Preservation by Metallography Half day: 9:00AM-1:00PM Instructior: F. E. Schmidt, Jr. |
| Metallography often plays a major role in the forensic materials evaluation of "failures" and can be the basis for controversial opinions. Sometimes improper handling of artifacts in evidence, improper specimen preparation, and even improper polishing/etching can create false optical and SEM effects and observations. Actual examples will be discussed in the context of general materials, ferrous and non-ferrous metals, coatings, and ceramic materials. The affirmative use of acetate replication and other modeling (replica) materials will be discussed as preservation methods. The pros and cons in the use of various methods and materials will be reviewed compared to the ASTM guides for forensic investigations. The audience is invited to bring examples from their practice for discussion. |