One of the great pioneers in cell biology and microscopy, Hans Ris, died on November 19, 2004. Microscopy had been at the center of his many discoveries; his contributions to cell biology and microscopy resulted in many awards by the American Society for Cell Biology and the Microscopy Society of America in addition to becoming a member of the National Academy of Sciences. Hans Ris's studies included imaging of the structure of chromosomes, characterization of anaphase A and anaphase B during mitosis, quantification and characterization of DNA in chloroplasts and mitochondria, characterization of nuclear structure and nuclear pore complexes, cytoskeletal organization in parasites, and numerous others.

This symposium will highlight recent advances in microscopy that have contributed to advance our knowledge in cell and molecular biology in a variety of different systems and on different levels. Invited speakers will include current leaders in cell and molecular biology, as well as investigators with novel molecular imaging applications. Meeting attendees are strongly encouraged to contribute papers for platform and poster presentation on various aspects of cell and molecular biology to supplement the invited talks in the session.

Central to the exploration of disease etiology is an understanding of pathologic changes from the molecular to the gross level and imaging methods are core tools in this endeavor. This symposium will offer a broad array of presentations highlighting the use of microscopy and other imaging methods to explore both the causes and diagnosis of specific diseases at the molecular, cell, and tissue level. Individuals doing research in the mechanisms or diagnosis of disease are encouraged to contribute to this session. In addition to the role of cellular dysfunction in disease, the symposium will explore the contribution of normal processes, such as DNA repair, cell cycle control, apoptosis, intracellular signaling, etc. to the disease state.

In the wake of catastrophic events that threaten life and well being, including malevolent acts (e.g., release of biological or chemical weapons) and natural disasters (e.g., hurricanes and tsunamis), identification of pathogens and collection and attribution of non-microbial forensic clues are crucial steps in treating the affected and identifying the source of the problem. Microscopy and microanalysis play an important role in the response to such calamities. In many cases, microscopy-based methods lack the sensitivity and specificity of molecular tests for pathogens (e.g., polymerase chain reaction for genomic material) or non-microbial agents (e.g., chemical assays for specific toxins). They make up for this by their ability to detect a broad range of microbes and chemical substances rapidly, often with minimal a priori knowledge of the offending agents present. Of necessity, investigators using microscopes to search for evidence after a catastrophe must have an extensive knowledge of the spectrum of things they may encounter. Though microscopic analysis of microbial and non-microbial agents are distinct disciplines, they share a considerable interface (for example, in the materials analysis of additives in weaponized microorganisms). By combining biological characterization methods with those from the physical sciences, a team of analysts can develop a comprehensive picture of the agent (organism, size, morphology, chemistry, additives, etc). Invited presentations will cover the use of specific instrumentation and correlative methods as well as procedures such as immunohistochemistry. Contributed papers on technology of identification are also encouraged.

The goal of this symposium is to capture the state of the art in the the use of cryo-electron microscopy and three-dimensional image reconstruction techniques, either alone or in combination with other relevant approaches, to elucidate the structure, assembly, and dynamic properties of macromolcular machines. It is intended to illustrate advances in (but by no means limited to) the following areas of research; progress towards higher resolution imaging; the use of correlation averaging techniques to enhance the resolution of and information yield from cryo-electron tomograms; multi-model reconstructions to capture distinct conformations and dynamic properties; enhanced interpretation from docking crystal structures of subunits; interaction of machines with substrates; innovative computational approaches.

This symposium will emphasize emerging preparative and labeling technology for use in high resolution and correlative studies. It is becoming increasingly important to visualize, identify, and localize/co-localize multiple molecules and molecular complexes within cells and tissues. Currently our knowledge of the various molecular species within cells is expanding rapidly; determining the organization and movement of these components at the cellular and molecular level is a critical step in understanding cell function. Preparative and labeling methodology that permits the sequential examination of specimens in several microscopic modes is key to the success of these efforts. Live specimens stained or labeled for examination via various modes of photon based imaging must be prepared for subsequent examination at substantially higher levels of spatial resolution using electron based or force based imaging (SEM, TEM, AFM). This requires preparative technology that maintains molecular and sub-molecular structure in the face of low and high accelerating voltages. Similarly, labeling methodology that is compatible with, and provides information from, more than one microscopic mode and generally at different levels of spatial resolution is also a requirement. Advances in preparative and labeling technology that facilitates correlative LM, TEM, and SEM will be addressed. Contributed platform presentations and posters dealing with novel preparative and labeling approaches are encouraged.

Structural analysis of plant cells and photosynthetic microorganisms has long been a key component in advancing our understanding of fundamental processes, including photosynthesis. In this age of genomics, microscopy has also played a central role in our efforts to achieve an integrative understanding of cellular and organismal function. This symposium will highlight recent advances in the application of microscopy, including light and confocal microscopy, TEM, SEM, and AFM, in addressing and solving key questions about plants and photosynthetic microorganisms and their interaction with the environment. Lectures and poster presentations will examine the two- and three-dimensional fine structure of plant cells and of photosynthetic microorganisms, the architecture of macromolecular complexes in native membranes, cellular responses to environmental factors, membrane and cell wall biogenesis, development, and plant interactions with other organisms. Discussions will address the application of new cell preservation and labeling techniques. This symposium will also emphasize recent developments in electron microscope tomographic analysis of the three-dimensional fine structure of plant cell structures and organelles, and photosynthetic microorganisms.

Microscopy is one of the most significant enabling technologies for nanoscience and nanotechnology. Scanning-probe and electron-beam techniques are pushing the boundaries of lithography and material/device assembly. Microscopy techniques are also critical for structural and chemical characterization of nanomaterials and nanodevices. This symposium will address the forefront of electron, optical and scanning probe microscopies in the field of nanoscience and nanotechnology. We solicit both platform and poster presentations that discuss the development and utilization of microscopy techniques for nano-lithography/patterning, material and device assembly, nanomaterial characterization, dynamics of nanomaterials and devices, and device characterization. The contributed presentations will complement an invited speaker series, including international leaders in nanoscience and nanotechnology and government representatives from U.S. and international nanoscience centers.

Suggested Sessions:

• Recent advances in electron beam and scanning probe lithographies
• Material and device assembly via scanning probe techniques
• Discovery of novel growth phenomena or nanomaterials systems
• In-situ observation of nanomaterial growth and dynamic processes
• Novel microscopy techniques for studying structure and chemistry of nanoparticles, nanotubes, nanobelt and nanowires
• Electron nano-crystallography/3-dimensional imaging
• In-situ microscopy and measurements for nanotechnology
• Challenges in the EM study of organic nanostructures and nanocomposites
• Characterization of nanodevices
• Localized optical and electronic property measurements

Microscopy is playing a key role in understanding and predicting how catalysts and nanoparticles work in chemical reactions, maintaining a clean environment, sustainable alternative energy sources, sensors and novel green routes to polymers. This timely symposium will focus on the pivotal role of innovative microscopy and microanalysis methods in the development of novel materials and processes for hydrocarbon catalysis, production and storage of energy, climate control and surface modifications for sensors. The methods include: in-situ environmental microscopy, high resolution and ultra high vacuum microscopy methods, aberration-correction, scanned probe microscopy, tomography, advanced spectroscopy, diffraction, modeling and novel sample holders. The topics include catalysts for selective hydrocarbon catalyzation, polymerization and hydrocracking, pollution and auto exhaust emission control, photocatalysis, biocatalysis, surface engineering, advanced fuel cells, alternative energy sources, gas sensing materials for sensors, new routes for nanoparticles and carbon nanostructures. Both platform and poster contributions are welcome from participants to supplement invited talks.

This special symposium will honor Art Chodos and will highlight his contributions to quantitative x-ray microanalysis and the Microbeam Analysis Society. The honorary session will encompass quantitative x-ray microanalysis of terrestrial and extraterrestrial materials with an emphasis on measurement technique, microprobe automation, analytical methods, and correction algorithms. Current topics in quantitative microanalysis will also include research on correction procedures, Monte Carlo methods, compositional mapping, and techniques implemented on the VPSEM, TEM, and on the electron and ion microprobe. We welcome contributions on these topics, the analysis of insulating materials, rough surfaces, particles, and thin films, and other novel applications to current analytical problems.

The direct visualization of dislocations in the TEM was first reported in 1956. This Anniversary Symposium will review the status of the subject, the historical development and the challenges for the future as the direct imaging of core structures becomes more routine, even at the highest resolution. There was, of course, extensive evidence for the existence of dislocations before they were imaged in the TEM and the techniques used in these early studies, together with more recent techniques such as STM and AFM, will be included in this celebration. The invited talks will be supplemented by contributed ones and an active poster session. All talks and posters will be eligible for submission to the Special Symposium Issue of the Journal of Materials Science.

The mechanical properties and related deformation phenomena of materials at both the micron and nanometer length scales are critical to the overall mechanical behavior and service life of most materials. The ability to visualize and measure elastic and plastic deformation at these length scales remains a challenging research problem, but is also a technical area with exciting new developments. This symposium will review the current state of technique development and application to a wide range of materials. This symposium is intentionally broad in scope and appeal, in order to create discussion among specialists who might not otherwise interact. Invited talks will discuss the development and application of techniques such as synchrotron x-ray microscopy, in-situ TEM experiments, electron back-scattered diffraction, and scanning probe microscopy. Contributed presentations and posters are encouraged both in the development and in the application of microscopy techniques for probing mechanical phenomena at small length scales.

Important technological areas, such as information storage and sensors, demand improved magnetic materials. Since magnetic properties are strongly microstructure-dependent, development of structure-property relationships requires a wide range of advanced methods. This symposium will cover all aspects of microscopy and microanalysis in magnetic microstructure and magnetic imaging, including both characterization methods and advancements in experimental techniques. Of particular interest will be papers concerning nanoscale materials such as magnetic nanoparticles and magnetic recording media, as well as spintronic materials such as spin valves and spin tunnel junctions. However, submissions are encouraged that report on relatively non-conventional characterization methods for magnetic materials, such as X-ray microscopy/PEEM, atom probe, and scanning probe microscopy, as well as reports on investigations of permanent magnets, soft magnetic materials, and all other magnetic materials.

The use of polymers has been increasing in the automotive, aerospace, medical and many other industries; therefore, there is a need to cross-section, prepare and understand their structure. This symposia will give material's people a forum to present and discuss current preparation and analysis methods for polymers.

The materials, manufacturing processes, and geometry of the parts used in medical devices present a unique set of challenges for the metallographer. The highly non-corrosive alloys, super-elastic materials, combinations of different materials and coatings and the small size of the finished devices require special mounting, grinding, polishing, etching and analysis techniques. This symposium will provide metallographers with a forum to present and discuss solutions to the problems encountered while working with medical devices.

Nanotechnology brings us the promise of devices and materials with extraordinary abilities; the first nanostructured materials and functional nano-devices have already been fabricated and can be classed as the first generation of nanotechnology. Imaging and analysis of these devices for the purposes of product development and quality control present multiple issues. Nanotechnology utilizes the fundamental behavior of materials at the atomic and molecular scale. Imaging nano-devices is problematic due to the characteristics and the diverse materials used in fabrication. Traditional analytical procedures must be modified to encompass the diverse range of materials present and scaled to the minute quantities. Microscopy and microanalysis are critical for the development and commercialization of nanotechnology. In fact, the future of the entire nanotechnology revolution depends on them. This symposium presents a forum for discussion on state-of-the-art methods to characterize nanotechnology, both for research and commercial development of improved devices and production techniques. Open to all areas of nanotechnology research including but not limited to; nano-electronics, nano-photonics, micromechanical devices (MEMS) and Bio-MEMs. We seek examples that illustrate the adaptation of existing analytical and imaging techniques as well as those that present novel methods.

Performance of an engineering material depends on its structure at various length scales. Special techniques have been developed for characterizing materials from nanometer to millimeter scales. However, these techniques are often not well integrated. This symposium will focus on the conjunction and integration of various characterization techniques and tools for compre-hensive study of the structure of a material across a wide range of length scales.

Automated TEM applications are becoming increasingly sophisticated and many experiments that were difficult or impossible are now becoming routine. For example, automation in cryoEM has shown that hundreds of high quality images can be collected in a single session with little or no operator intervention. Another example is EM tomography where automated collection of tilt series data is now a routine practice. These applications integrate instrument and detector control with sophisticated software packages and databases. This symposium will provide a survey of leading edge methods and applications in automated TEM for the biological, materials and analytical sciences communities. The symposium will also address current challenges to automation application development. Contributions are encouraged in all aspects of TEM automation including software, instrumentation, and applications.

Cryo-examination of frozen hydrated biological samples permits investigation with nm resolution of cellular structure by using cryo-TEM, cryo-SEM or cryo-FIB/SEM. The optimal goal of cryo-preparation is to achieve vitrification of water in the sample, particularly when cryo-TEM is to be performed. Cryo-preparation is achieved by rapid cryoimmobilization, using plunge freezing for thin samples, or high pressure freezing for thicker, bulk samples (bacteria, cells, etc.). For immunological labeling, cryo-sectioning provides access to normally inaccessible intracellular antibody sites. A new approach,cryo-sectioning or cryo-planing of cells, involves direct examination of cell fine structure, after brief etching and metal coating, using high-keV field-emisson SEM with backscattered electron imaging. Cryo-FIB/SEM is a new development for biological work, and provides the opportunity to examine FIB-cut sections of a cell multiple times, thus providing a tomographic-like approach by cryo- SEM. In addition, cut surfaces of a cell may be examined at 90* to one another. These topics, as well as others, will be discussed as advances in cryo-examination of biological samples.

Electron Energy-Loss Spectroscopy (EELS) can provide quantitative information on elemental composition and electronic structure at high spatial resolution. Thanks to significant progress in instrumentation, such as improved energy resolution and detector design, together with advances in theoretical methods, EELS has become extremely powerful for characterization of nanomaterials. Contributions are invited on all aspects of EELS including: new developments in EELS instrumentation, near-edge structure interpretation, quantitative interpretation of both core-loss and low-loss spectra, and advanced applications to problems in materials and life sciences. The symposium will also celebrate the significant contributions of one of the pioneers in the field, Prof. Ray Egerton, who will open the symposium with a special keynote lecture.

For many materials and biological systems, the properties of the outer surface (top 1-5 nm) dictate the performance. The surface analyst is being asked to detect and image species present in lower concentrations and within smaller spatial dimensions. Such analytical requests are driving the development of new and/or improved surface analytical instrumentation as well as data analysis tools. Invited talks in this symposium will emphasize: (1) state of the art surface analytical instrumentation, (2) advanced data analysis tools, and/or (3) the use of complimentary surface analytical instrumentation to perform a complete analysis of complex materials and/or biological systems. Talks in this session will also discuss current (and future) surface analytical challenges. Meeting attendees are urged to contribute both platform and poster presentations to supplement the invited talks.

Focused ion beam (FIB) instruments (FIB alone or FIB/SEM combined systems) have become an important capability for laboratories in both physical and biological sciences. FIB has recently been used to facilitate 3-D microstructural studies that include other imaging techniques like EBSD and x-ray microanalysis as well as the production of 2-D and 3-D nanostructures. We seek contributions that discuss the basic understanding of ion-solid interactions and ion- or electron-beam-induced chemistry for etching and/or deposition. We welcome reports of novel applications, new procedures, new instrumentation, and case studies, relating to the use of FIB and FIB/SEM in the microscopy laboratory.

The introduction of aberration correction and monochromation has successfully led scanning transmission electron microscopy and electron energy loss spectroscopy into the sub-angstrom/sub-eV regime, pushing the sensitivity down to the single atom level. This has opened the door to a new, more sophisticated understanding of materials properties. This session will explore the application of these new methods to a wide range of materials. Presentations will include not only advances in electron optics, but also new applications such as STEM tomography. Conference attendees are encouraged to contribute both platform and poster presentations to supplement the invited talks of the session.

In celebration of the 50th anniversary of x-ray mapping in scanned beam instruments, this symposium will focus on the current state of chemical and elemental mapping techniques in the field of microanalysis. Invited papers will highlight recent advances in chemical imaging and advanced analysis of the results. Contributed papers are welcome on all acquisition techniques and spectroscopies capable of elemental or chemical mapping with high spatial resolution, including full-field imaging modes such as energy-filtered TEM as well as methods employing the "flying spot technique". Contributions are also encouraged on applications of chemical imaging techniques to problems of practical importance and advances in the statistical analysis of multispectral and hyperspectral datasets.

Ultrafast Science is a growing technology area, particularly among practitioners of optical and x-ray methods. This is driven by the desire to understand the fundamental mechanisms underlying complex transient phenomena such as chemical reactions and phase transformations which occur on time scales in the fs, ps, and ns regimes. The potential for using electrons as an ultrafast probe is just now being explored. Great progress has been made in ultrafast electron diffraction, and new work is emerging on ultrafast electron imaging. This symposium will explore established ultrafast electron diffraction technologies and new work associated with ultrafast imaging, as well as the potential of MeV electron diffraction and imaging instruments.

Low voltage microscopy has become the standard mode of operation for many microscopists. This session will focus on important new developments in this field including ultra-low voltage (500eV and below), SLEEM and LEEM, aberration corrected SEMs and their performance at low voltage, and advances in low energy microanalysis. We will also honor Dr. Oliver Wells, on the occasion of his 75th birthday, for his numerous and significant contributions to all types of scanning microscopy. The organizers welcome both platform and poster presentations in all of these areas.

Recent advances in instrumentation, including coherent sources, electron monochromators, and aberration correctors, have enabled microscope resolution limits to be pushed up to and beyond the one-Angstrom barrier. Useful practical experience with the various hardware and software approaches (aberration correction, electron holography, focal-series reconstruction) is being accumulated. Initial results with 200-300 keV CTEMs, mostly on well-defined objects, are impressive, stimulating much interest in the electron microscopy community at large. This symposium complements the Pre-Meeting Congress on "Materials Research in an Aberration-Free Environment", with a focus on recent progress in the field of high-resolution imaging with the CTEM. Emphasis will be given primarily to imaging applications since related topics (STEM, EELS) that are being covered elsewhere.

In 1953 Oliver Wells commenced a lifetime study of contrast mechan-isms in images obtained by SEM. Whilst SEM imaging at high vacuum and high voltage is well understood, there remains much to discover and explain in SEM imaging at low voltage and variable pressure. This symposium recognises and honors "Ollie's" passion for investigating contrast mechanisms. We invite contributions relating to progress in achieving high resolution and low voltage imaging in VPSEM/ESEM, particularly with regard to nanomaterials, nanostructures, and their metrology. This theme includes new or improved detection mech-anisms. A second theme concerns improvements to x-ray microanalytical techniques, including novel chemical and structural characterisation applications. Invited speakers will report on investigations into the range of contrast mechanisms in VPSEM/ESEM, and their application in the study of new materials. Contributed papers are keenly sought, as well. Appropriate references to the "War of the Worlds"or "Wookey Hole" are encouraged (come along for further explanation).

Scanning cathodoluminescence microscopy and spectroscopy currently play a pivotal role in the study of technologically important ceramics and semiconductors, as well as geological materials. Recent innovations in SEM instrumentation that provide enhanced low voltage performance and variable pressure operation, as well as improvements in light detection and measurement technologies, have considerably enhanced the microanalytical capabilities of the CL technique and expanded its scope of applications. In this symposium, invited speakers will cover a broad range of advanced CL applications in addition to recent developments in CL instrumentation and analysis techniques. The topics include: CL studies of opto-electronic and geological materials, low voltage CL microscopy and spectroscopy, CL data interpretation using Monte Carlo simulation techniques, time- and depth-resolved CL analysis, CL microanalysis in the VPSEM, emerging CL instrumentation and techniques and CL analysis of nano phase materials and structures. Contributed papers to the symposium as either platform or poster presentations are welcome.

Electron tomography continues to experience rapid growth, and new applications bring new challenges and innovations. In materials science, the resolution has been pushed close to one nanometer, while in biology steady progress is being made in tomography of frozen-hydrated specimens. Electron tomography is now being used for 3-D compositional mapping, and methods of electron tomography based on serial focal planes rather than tilt-series images are being developed. Meanwhile, the ready availability of routine electron tomography is yielding exciting discoveries in many fields. Other methods of tomography are being developed as well, including x-ray microtomography, focused ion beam tomography, and atom probe tomography. These methods broaden the range of scales and applications of the technique. We anticipate a wide variety of papers on both applications and technique development.

Metallographic techniques are applied to virtually all known materials, not simply metals and their alloys. The growth in materials and processing technologies has produced many new challenges for the metallographer. This symposium will draw together metallographers working on a wide range of materials, produced by many different methods, to discuss their efforts at revealing and characterizing these microstructures. Characterization technologies covered in this symposium center on light microscopy, but contributions relating to virtually any technique are welcome.

Many metallographers and materials engineers become involved in failure analysis at some time in their career, often as a consultant after obtaining years of experience - vitally necessary in this field. Unfortunately, structures do fail and components do break, despite the vast improvements in our ability to predict the location and magnitude of stresses, and our vast knowledge of fracture mechanisms. This symposium provides failure analysts with a forum to present results of their studies and to exchange ideas.

Pharmaceutical research and development laboratories are at the forefront of science. Much of the work performed in pharmaceutical microscopy and microanalytical labs is similar to that done elsewhere; however, there are specialized technologies and themes that are of particular value to microscopists in the industry. It is the objective of this symposium to present a variety of biological and materials science applications of significance to the pharmaceutical community. Invited speakers will include current leaders in their respective disciplines. Additionally, in response to feedback from previous meetings, an informal forum will be provided for sharing of thoughts and strategies related to regulatory and other issues faced in our laboratories. Contributed papers for platform or poster presentation on related topics are encouraged and welcome.

Sample and instrument cleanliness is a key issue in electron and ion microscopy-based imaging, analysis and manufacturing. This holds true especially for nanometrology and nanotechnology where even small amounts of contamination or alteration of the specimens could be unacceptable. Sample cleaning and contamination control are new active areas of research and development. Papers are invited concerning contamination measurement methods, specimen and instrument cleaning, including plasma and trapping techniques, and clean instrument manufacturing.

Computer aided image analysis has developed into an extremely powerful tool for the metallographer. This symposium will be an opportunity for users to present and discuss the varied application of digital imaging and measurement in materials characterization.

Computer technology is changing the ways we access equipment, view samples, record, manage, and disseminate images. Inside the laboratory, computers and digital imaging has created a need for archiving systems, and for managing and manipulating images. They can also help produce digital tools to instruct new users. Outside the lab, computer controlled instruments and digital imaging make it possible for classroom students to view and analyze microscopy data and images without requiring a user to be physically in front of the microscope. In addition, digital imaging has greatly increased the ease and possibilities for the public at large to see microscopic images in print media and museum exhibitions. This session will look at computerized uses of microscopes (e.g., from virtual microscopes to telemicroscopy), new teaching tools (e.g., digital training) in research and teaching laboratories, outreach programs for classrooms and other public venues and curricula for some of these programs.

As analysts become more specialized and narrowly focused, we cannot lose sight of the hierarchy of analysis that leads us to our specific goals. Everything we analyze begins with the examination by the unaided eye - what is the color, the shape, the size, the defect? Those first impressions logically lead us to the next step - optical microscopy and analysis. The world of optical methods has expanded beyond the compound optical microscope and garden variety light source to include full body macroimaging, disease characterization, chemical species mapping and new source probes. Join us for presentations that will start with a refresher on objectives and illumination types and proceed to multiple applications in the biological and materials sciences.

Recently, crime shows have become some of the most popular ones on television. However, most of us analysts know that finding the answers is not always as easy as pushing a button and obtaining a printout! Join the Tech Forum as we explore the realm of forensic testing labs - not just for solving crimes, but for reconstructing events and determining the sources of environmental accidents.

Although electron microscopy is constantly evolving, we all have to begin at the same place - how to prep, which microscope, what stain, what size, what voltage, etc. This roundtable will bring together a number of panelists who will discuss the basics of EM from preparation through examination of biological and materials samples. No question will be too basic - please come to learn and even share your ideas.

Microwave processing techniques are improving at an incredible rate. We use microwave processing for fluorescence labeling, immunogold labeling, decalcification, antigen retrieval, and TEM and SEM processing for biological specimens. If it works conventionally, it is likely to work in the microwave. The advantage is savings in chemicals, time, and labor. Typically, fluorescence labeling, with the cells mounted on slides ready for the confocal microscope, takes 30 minutes. The cells are fresher and there is usually less background. For TEM processing, the time from fixing to cutting is 2-3 hours. Microwave processing comes between high pressure freezing and conventional processing in regard to the amount of extraction that takes place. This talk will explain the workings of the microwave and give examples of microwave results in comparison with conventional techniques.

Cryo-electron tomography is a rapidly developing technique that produces 3D images of frozen-hydrated specimens with much potential for the characterization of biological structures and macromolecular assemblies in situ. Such information can provide detailed insights into the structural basis and ultimately the function of many cellular processes. A general introduction into the fundamentals of cryo-preparation and electron tomography will be given. We will also demonstrate and discuss both strengths and limitations of the technique in theory and with cell biological examples.

The availability of 3-D microstructural information is becoming increasingly important for understanding the complex microstructure-property relationships in advanced materials. Mechanical serial sectioning is a well-established technique for obtaining 3-D microstructural data from standard metallographic specimens. Traditionally, layer removal has been done by hand, using standard metallographic polishing techniques. This tutorial will begin with an introduction to manual serial-sectioning methods, their applicability and limitations. Special emphasis will be given to techniques for maximizing the fidelity of the data, including imaging and alignment issues and useful image processing tools. The tutorial then outlines modern methods for automation including robotic specimen manipulation, automatic image capture and automatic specimen prep which can reduce the time to acquire data volumes by around 2 orders of magnitude, compared with manual techniques. Selected examples will be given where automation has enabled the systematic study of microstructures, using a variety of experimental set-ups. The tutorial also will discuss the future of the technique.

Acquiring 3D data sets by means of serial sectioning techniques requires careful alignment of the individual 2D images. In this tutorial, we will work through the various image processing steps that need to be carried out in order to convert a 2D image stack into a 3D object. We will discuss cross-correlation techniques, histogram adjustments, and a variety of other approaches. A brief review of various free and commercial software packages will also be included.

The ability to characterize material microstructure in 3-D is a critical methodology for developing unbiased structure-property relationships. This tutorial will cover experimental approaches to use and optimize the Dual-Beam Focused Ion Beam Scanning Electron Microscope (DB FIB-SEM) to perform serial sectioning experiments at the micron-size scale. The tutorial will cover the state-of-the-art advances as well as current limitations of this technique, and in particular will cover the integration of ion beam imaging, EBSD and EDS mapping into the serial sectioning experiment.

A three-part tutorial program will be compiled to help microscopists and materials scientists (1) understand the state-of-the-art in instrumentation for atom probe tomography and, (2) learn about advanced specimen preparation techniques. And (3) explore applications in the study of advanced nanomaterials. This will include studies of Si-based semiconductor devices, advanced aluminium alloys, zirconium alloys, and spinodal systems and involve an analysis of solute distribution, states of clustering, nucleation and the characterisation of nanoscale precipitation and phase decomposition, beam imaging, EBSD and EDS mapping into the serial sectioning experiment.

This tutorial covers many aspects of CCD technology as they relate to modern TEM functionality. Fundamentals of CCD camera construction, including scintillator considerations, number of pixels, pixel size, camera speed versus read-out speed, lens coupled versus fiber optic coupled, and speed versus sensitivity trade-offs will be discussed as they relate to the actual use of the TEM. Use of TV cameras on a TEM will also be addressed. By the end of the tutorial, the attendee will be able to make a better informed decision as to what moving up to a digital camera will bring about in terms of benefits to the users EM facility. Potential future directions in this developing area will also be discussed. Both the materials sciences and the life sciences TEM user will be addressed.

Electron tomography is a powerful method for obtaining the three-dimensional structure of a specimen from a set of images taken at a series of tilt angles. This tutorial will introduce the basic principles of tomography, then go through the series of steps involved in building a tomographic reconstruction with the IMOD software package. This will include the reconstruction of a single volume from tilt series taken around two orthogonal axes, a method that can significantly improve results for some specimens. The tutorial will also cover how to deal with some of the problems commonly encountered when doing tomographic reconstructions.

The successful "Experts" sessions began in 1997 as a novel means of communicating scientific knowledge. Essentially, hot topics are identified and experts are located to answer questions posed from the audience. One or more invited "experts" makes a short presentation to introduce the topic. Audience members then ask questions and the "experts" provide answers. Other members of the audience may also contribute answers to some problems. Sharing of experience and information is strongly encouraged as the purpose is to have a dynamic discussion among the panel and audience participants. The topics for 2006 are:

Physical Sciences
Routine and Advanced Applications of EBSD
Organizer: Roy Geiss
Experts will describe both routine and advanced applications of electron backscatter diffraction in material science. Discussion topics will include orientation imaging, phase identification and strain measurement.

Biological Sciences
Application of Low Voltage STEM
Organizer: Edward Principe

Experts will describe the applications of low voltage STEM imaging in the biological as well as material science disciplines. Discussion topics will include advantages, disadvantages and limitations of low voltage STEM as well as possible future directions for the technology.