This short course will cover topics within the field of image analysis. The topics will be covered in an easy to understand format so that a wide range of users and potential users can understand the concepts and how image analysis will make their life in the laboratory more productive when it comes to quantita-tive image analysis. The topics will range from high-resolution cameras and other input devices to image processing algorithms and how best to extract quantitative data. However, this workshop is NOT from a theoretician's or computer programmer's perspective, but from the view of someone who simply wants to use the software in a productive way. Tips and tricks will be identified where appropriate, with critical pauses at every juncture in order to explore issues as they relate to attendees' current projects. Step-by-step procedures for capturing an image, enhancing if needed, segmenting into a binary image, processing the binary image, and measuring features will be described. Considerations for using a scanning stage and auto focus along with various types of microscopes will be discussed. In addition, key factors in determining whether time should be spent developing an automated analysis procedure as opposed to semi-automated or manual quantification will be debated.

Immunogold labeling is the most widely used approach for subcellular localization studies, allowing high-resolution detection of macromolecules of interest. Although protocols are readily available in the literature, understanding how each reagent works, and why each step in a protocol is necessary, is the key for successful labeling. Equally important is knowing what sample processing method to choose, based on the type of specimen used and research question being asked. This short course will include the following topics, and participants are invited to bring questions regarding their own areas of research:

1. The properties of gold particles and their protein conjugates
2. Theories underlying immunogold labeling protocols
3. Choosing the right reagents for background reduction
4. Enhancement of gold particles
5. Immunogold labeling on a variety of sample preparations for LM and EM
6. Embedded sample labeling vs. hydrated sample labeling

Confocal technology is rapidly evolving, and now often includes systems with new lasers, detectors and spectral imaging capabilities that were not available two to three years ago. Thus, Jay and Silent Bob have revived their full day workshop "Basic Confocal Microscopy" to expand upon a number of topics that students, technologists and others need for efficient use of confocal microscopy to obtain publication-quality images and three-dimensional data. The emphasis of the workshop will be on basic information directed at beginning and intermediate users, and will include an overview of some applications of confocal microscopy, followed by topics that include the basic components of a confocal microscope (lasers, dichroic mirrors, microscope objectives, photomultiplier tubes, etc.), and applications of digital imaging in confocal microscopy. During the discussion on these topics many of the concerns that a researcher must be aware of in properly setting up the user adjustable parameters for optimized image collection will be addressed. Although the emphasis of the discussion will be on single-photon laser-scanning confocal systems, other types of confocal microscopes such as multiphoton and spinning disk systems will also be discussed. Although optimizing the operational parameters of the confocal microscope will be at the core of the course, the data collected is only as good as the specimen being observed. For this reason, the course will include discussions of optical properties of specimens, specimen preparation, basic fluorescence microscopy, historical and new fluorescent probes, general digital imaging concerns, and pitfalls and procedures of three-dimensional reconstruction.

Where to begin? Have you ever been handed a failure investigation and were not quite sure about all the steps required to complete the investigation? Or perhaps you had to review a failure investigation and wondered if all the aspects had been properly covered? Or perhaps you read a failure investigation and wondered what to do next? The initial steps of a failure investigation set the direction and, in many cases, ensure a successful investigation, or doom it to failure. Here is a chance to learn the steps to or-ganize a failure investigation and ensure success. The importance of a failure investigation crosses company functional boundaries, and it is well known to companies large and small. It is an integral component of any design or manufacturing business op-eration. However, a poorly-organized failure investigation may not provide the necessary information to solve the manufacturing problem or assist in a redesign. In this course, you will learn a proven systematic approach to failure investigation, which utilizes examples from the aerospace industry and teaches the steps you need to follow. The effect of various failure sources, such as corrosion, on the investigation will be analyzed. This course will provide a learning platform for engineers from all disciplines; materials, design, manufacturing, quality and management.

For many biological and materials systems, the properties of the specimen's outer surface dictate its performance. Surface analysts are being asked to detect specimen components present in ever lower concentrations and within smaller spatial dimensions. This short course will describe and contrast the main surface analytical instruments: Auger Electron Spectroscopy (AES), X-ray Photoelectron Spectroscopy (XPS), Secondary Ion Mass Spectrometry (SIMS)/Sputtered Neutral Mass Spectrometry (SNMS), and Scanning Probe Microscopy (SPM). Emphasis will be placed on the principles of each technique and on data interpretation. The limitations of each technique will be discussed. Upon completion of this short course, the attendee will be able to properly select which state-of-the-art surface analysis technique(s) should be used to address spectroscopy, imaging, and depth profiling analysis requests from their col-leagues/customers. Vendor participation in this short course is expected.

The scanning electron microscope is a very powerful instrument for characterization on the micro- and nano-scale. In recent years the power of the instrument has been greatly increased by adding the ability to do crystallographic characterization (through EBSD) to the study of morphology (through imaging) and composition (through EDS). This short course will cover the basic principles of EBSD, the hardware required, sample preparation, and orientation map analysis and display. Real examples from the lecturers' laboratories will be used to illustrate these important points. At present, EBSD is used in two distinct ways. On the one hand it is used for mapping and obtaining statistical information on, for example, texture, grain size, and grain boundary properties. On the other hand it is used for identifying the crystal structure of isolated crystals (in the form of particles or precipitates, for example). Principles and examples of both modalities will be covered. There will also be discussion of some advanced topics of current research such as: the accurate determination of lattice parameter; the measurement of strain; simulation of the patterns. There will be an opportunity for each of the major manufacturers of EBSD to present the latest improvements in their hardware and software for EBSD.