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In-Week Workshops MM2008 Boot Camp Workshops (PDF) Monday - Thursday August 4-7, 8:30 AM to 12 Noon (each day) Participation in the following Mult-Day In-Week Workshops requires an additional fee X19 Theory and Techniques of Aberration-Corrected Microscopy Harald Rose, Michael O'Keefe, Andrew Lupini and Edgar Voelkl (additional fees apply)
Imaging and analysis of materials structures at near-1-Angstrom spatial resolutions provide characterization solutions for high-tech problems that cannot be otherwise addressed. These capabilities are provided to increasing numbers of R&D scientists worldwide by recent advances in aberration-corrected electron microscopy. Aberrations are corrected either directly by hardware, such as special lens elements interfaced to modern field-emission electron microscopes, or by software-based methods, such as focal-series reconstruction and electron holography techniques. These capabilities were until recently the province of a few specialists; this in-week tutorial will provide to the attendees, for the first time, a comprehensive overview of the range of techniques, from world-renowned experts.
Additional Info on this In-Week Workshop.
X20 Basic Principles of Confocal Microscopy Jay Jerome and Bob Price (additional fees apply)
Confocal microscopy has become a primary method for visualizing structure in three dimensions. The technology is rapidly evolving with new instruments, lasers, detectors, and spectral imaging capabilities. We will instruct beginning and intermediate researchers on carrying out successful biological confocal microscopy experiments. Emphasis will be on practical aspects of specimen preparation, instrument setup and operation, and enhancement and analysis of the digital images collected by confocal microscopy. A general knowledge of optical microscopy is helpful, but no prior knowledge of confocal microscopy is necessary to benefit from the workshop.Additional Info on this In-Week Workshop.
X26 Nanomaterial Microscopy and Microanalysis: Tools and Preparation Phil Russell and Donovan Leonard (additional fees apply)
With the wide variety of analytical instrumentation available, the selection of the correct ÒtoolÓ for analysis of
nanomaterials is critical. By introducing various microscopy and microanalysis methods this workshop should
provide a solid foundation for nanomaterial characterization for the beginning to intermediate investigator. The
importance of choosing the proper preparation technique, to minimize introduction of artifacts and ensure that
representative samples are identified for subsequent analysis, will also be discussed.Additional Info on this In-Week Workshop.
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