| Contact | Description |
Peter Tarquinio
Evex
857 State Road
Princeton, NJ, 08540
United States
Email: ptarq@evex.com
WWW: www.evex.com
Posted: ptarq@evex.com
MSA-Ref#: 8388668 |
| Topcon ISI ABT-55 SEM (Scanning Electron Microscope) Optional Evex X-ray Analyzer |
Topcon ISI ABT-55 SEM (Scanning Electron Microscope)
Optional Evex NanoAnalysis System (Detector, Spectral Engine, Imaging Engine, Elemental Mapping)
Microscope can be inspected.
Please call to make an offer. |
|
Steven Cogswell
University of New Brunswick Microscopy and Microan
10 Bailey Drive
Fredericton, New Brunswick, E3B5A3
Canada
Email: scogswel@unb.ca
WWW: http://www.unbf.ca/mmf
Posted: June 10, 2008
MSA-Ref#: 8388669 |
| JEOL SM-OM40 Optical Microscope for SEM |
We have a surplus JEOL SM-OM40 Optical microscope for sale. This was removed from our JEOL JSM-6400 SEM when we also dismantled its wavelength spectrometer setup.
This is the microscope you use to set the proper height of your sample in the SEM chamber for wavelength/EDS work. It was in fine working condition when removed.
Pictures and more detail are available on request. |
|
Tony Owens
Tescan USA Inc.
508 Thomson Park Drive
Cranberry Twp., PA, 16066
USA
Email: towens@tescan-usa.com
WWW: http://www.tescan-usa.com/UsedSEMs.htm
Posted:
MSA-Ref#: 8388670 |
| JEOL JSM-5310 Scanning Electron Microscope |
JEOL JSM-5310 Scanning Electron Microscope for sale.
This instrument was received as a trade-in from a new customer and came with all operating manuals and technical documentation. The microscope is in very good condition and is currently installed and running in our applications lab in Cranberry Township (Pittsburgh), PA. The SEM is available for on-site demonstrations or you are welcome to send samples for us to image. Instrument photographs and technical specifications are available upon request. We will consider any reasonable offer. |
|
Gary Brake
SEMTech Solutions, Inc.
6 Executive Park Drive
North Billerca, MA, 01862
USA
Email: gbrake@semtechsolutions.com
WWW: http://semtechsolutions.com
Posted: June 13, 2008
MSA-Ref#: 8388671 |
| ZEISS -LEO 1560 FE Scanning Electron Microscope w/ EDS |
ZEISS-LEO model 1560 GEMINI FE Scanning Electron Microscope
Schottky Thermal FESEM system with the following features:
RESOLUTION – 3nm @1kV – 1nm @ 20kV
ACCELERATING VOLTAGE – 200V to 30kV
PROBE CURRENT – 4pA to 10nA
MAGNIFICATION – 20x to 900,000
SPECIMEN CHAMBER - Large (520mmÔ – 320mm Height)
SECIMEN EXCHANGE AIRLOCK - Large (210mm x 50mm)
BSE DETECTOR - Retractable Robinson Backscattered Electron Detector
IN-LENS DETECTOR - High Efficiency Annular In-Lens Detector (SE)
IN-CHAMBER DETECTOR - E/T Detector Mounted in Chamber (SE)
IMAGE ACQUISITION RESOLUTION – 512 x 384 to 3072 x 2304 Pixel
IMAGE PROCESSING – Pixel Averaging, Frame Averaging, Continuous Averaging
IMAGE DISPLAY – Two 19” Monitors with Image Display 1024 x 768 Pixel
IMAGE RECORDING – High Resolution Photo Unit
IMAGE RECORDING – Thermal Printer Mitsubishi Model CPD800DW
6 AXES FULLY EUCENTRIC SPECIMEN STAGE - (Motorized)
SAMPLE VIEWING –IR CCD Camera for Sample Viewing
WATER RECIRCULATOR – Harkris Chiller
CHAMBER VACUUM SYSTEM – 240 l/s Turbomolecular Pu
EDS
Demonstrations available. |
|
John Wimbush-Physis Lab Manager
University of Richmond Physics Dept
Science Center D-100
Richmond, Va, 23173
USA
Email: jwimbush@richmond.edu
WWW: http://www.richmond.edu
Posted: June 17 2008
MSA-Ref#: 8388672 |
|
We have an ISI DS130 Dual Stage Scanning electron microscope that we would like to use for some physics experiments. It was working before packing and shipping. The Users Manuals were lost during building renovations. If you know the where-abouts of a users manual or other documentations we could get (or copy) I would be most appreciative. I can be reached by email at jwimbush@richmond.edu |
|
Peter Tarquinio
Evex
857 State Road
Princeton, NJ, 08540
United States
Email: ptarq@evex.com
WWW: http://www.evex.com
Posted: ptarq@evex.com
MSA-Ref#: 8388673 |
| Used Jeol 6400 With Evex Digital Imaging System |
Jeol 6400 Scanning Electron Microscope (As Is) with Evex Digital Imaging System.
Please call for pricing and demonstration.
Regards
Peter |
|
Randy Tindall, Senior EM Specialist
EM Core
W125 Vet Med
Columbia, Missouri, 65211
USA
Email: tindallr@missouri.edu
WWW: http://emc.missouri.edu
Posted: 6-23-08
MSA-Ref#: 8388674 |
| Need used microwave sample processing system |
Due to the increasing volume of samples coming through our lab, we are in need of a microwave sample processing system for EM to supplement our existing Pelco Biowave system. Another Biowave would be ideal, but as long as the system can accommodate a circulating cooled water bath and vacuum chamber, has true variable wattage and is programmable, it will serve our needs.
Thanks!
Randy |
|
Peter Tarquinio
Evex
857 State Road
Princeton, NJ, 08540
United States
Email: ptarq@evex.com
WWW: www.evex.com
Posted: ptarq@evex.com
MSA-Ref#: 8388675 |
| Jeol 6300 Scanning Electron Microscope |
JEOL 6300 Scanning Electron Microscope - Used
with optional Evex NanoAnalysis System
www.evex.com
Call 609-252-9192 |
|
diane tomasich
via mazzarino 37
pescara, italia, 65100
italia
Email: ottagonosole@tiscali.it
Posted:
MSA-Ref#: 8388676 |
| used sem wanted |
USED SEM WANTED FOR A RESEARCH PROJECT. BRAND: JEOL, PHILIPS, ZEISS, HITACHI. ONLY WORKING INSTRUMENTS LOCATED IN EUROPE WILL BE CONSIDERED. BUDGET IS 10.000 EURO.
THANK YOU. |
|
Juan F. Hernandez
Materials Lab Analysis
Monterrey, Nuevo Leon, 64370
Mexico
Email: jfhpaz@gmail.com
Posted: 07/2/08
MSA-Ref#: 8388677 |
| Dritical Point Dryer |
Hello,
I am looking for a preowned Critical Point Dryer in any condition.
Please, contact me at jfhpaz@gmail.com
Thanks! |
|
Joe Robinson
Iota Technology Services
PO Box 91057
Portland, Or, 97291
USA
Email: joe@iotacs.com
Posted: July 29, 2008
MSA-Ref#: 8388679 |
| Wanted: Philips CM200/300 |
Im in the market for an IM voltage analytical TEM with EDX and TV camera.
STEM is not necessary. I am funded and ready to go. Prefer systems working and under vacuum but would consider non-working systems de-commissioned by OEM. |
|
Thomas Yasumura - Lab Coordinator
Colorado State University
Dept BMS-Anatomy
Fort Collins, CO, 80523
USA
Email: yasumura@lamar.colostate.edu
Posted: August 1, 2008
MSA-Ref#: 8388680 |
| Balzers 3mm specimen carrier wanted |
Looking for Specimen carriers (part # LZ02126VN in Baltec catalog) 3mm diameter used in freeze fracture device for purchase. |
|
Steven Cogswell
UNB Microscopy and Microanalysis
10 Bailey Drive
Fredericton, New Brunswick, E3B5A3
Canada
Email: scogswel@unb.ca
WWW: http://www.unbf.ca/mmf
Posted:
MSA-Ref#: 8388681 |
| Sample Holders for Philips EM400 Series TEM |
We have available two holders from our Philips EM400 TEM, and they likely fit the other EM4xx series goniometers, and other Philips models as well.
PW6594 Single Tilt / Rotation Holder
and
PW6595 Double Tilt Low Background Holder
More details and photographs can be provided on request. |
|
Gary Brake, Marketing Manager
SEMTech Solutions, Inc.
6 Executive Park Drive
North Billerica, MA, 01862
USA
Email: gbrake@semtechsolutions.com
WWW: http://www.semtechsolutions.com
Posted: October 1, 2008
MSA-Ref#: 8388682 |
| Hitachi S-4200 Field Emission SEM |
This SEM is in excellent condition. It has been under service contract since its install. The S-4200 comes equipped with an EDAX EDS system, Robinson BSE and Robinson ChamberView, as well as a cold finger. The imaging capability of this system is super. Recent improvements from SEMTech Solutions include our X-Stream Imaging System for digital image capture and networking capability using a Dell PC and MS Windows XP. The EDAX Genesis software has recently been updated (Oct. 2007) and manuals for both the Hitachi and EDAX systems are complete.
Main System Specifications:
Resolution: 1.6 nm @ 15 kV, 5 nm @ 1 kV
Magnification: 20x to 500,000x
Electron Gun: Cold-cathode Field Emission
Accelerating Voltage: 0.5 to 30 kV (100 V steps)
Objective Aperture: 4 selectable (self cleaning)
5-axis stage
- X: 0 to 25 mm
- Y: 0 to 25 mm
- Z (WD): 5 to 30 mm
- Tilt: -5 to +45o
- Rotation: 360o continuous
Maximum Specimen Size: 102 mm dia. (airlock specimen exchange)
Vacuum Sequence: Full-auto pneumatic valve system
Detailed quotation and demonstration are available upon request. |
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Microscopy Society of America